Using our confocal microscope, it is possible to examine samples for waviness and surface roughness. The measuring device offers the possibility to make 3D images of the surface, to analyse and quantify microstructures.
Technical data of the confocal microscope
- Measuring device: NanoFocus
- Resolution in Z-plane max. 10 nm
- Image field abe 150 x 160 µm
- Determination of roughness parameters and surface morphologies